DocumentCode :
2444430
Title :
Voltage Dependence of Magnetoresistance in Spin Dependent Tunneling (SDT) Junctions
Author :
Zhang, Juyong ; White, Richard M.
Author_Institution :
Carnegie Mellon Univ.
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
116
Lastpage :
116
Keywords :
Acoustical engineering; Aluminum; Electrical resistance measurement; Electrons; Impurities; Magnetic tunneling; Predictive models; Temperature dependence; Tunneling magnetoresistance; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.737202
Filename :
737202
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2444430
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