• DocumentCode
    2444430
  • Title

    Voltage Dependence of Magnetoresistance in Spin Dependent Tunneling (SDT) Junctions

  • Author

    Zhang, Juyong ; White, Richard M.

  • Author_Institution
    Carnegie Mellon Univ.
  • fYear
    1998
  • fDate
    6-9 Jan. 1998
  • Firstpage
    116
  • Lastpage
    116
  • Keywords
    Acoustical engineering; Aluminum; Electrical resistance measurement; Electrons; Impurities; Magnetic tunneling; Predictive models; Temperature dependence; Tunneling magnetoresistance; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-5118-5
  • Type

    conf

  • DOI
    10.1109/INTMAG.1998.737202
  • Filename
    737202