DocumentCode :
2444522
Title :
Miniaturized SnO2-based suitable for temperature-tailored lambda-ratio sensors
Author :
Ozafari, M.M. ; Khodadadi, A. ; Mohajerzadeh, S.S. ; Valinasab, M.
Author_Institution :
Dept. of Phys., Tehran Univ., Iran
fYear :
2001
fDate :
29-31 Oct. 2001
Firstpage :
87
Lastpage :
90
Abstract :
A sol-gel method for the fabrication of miniaturized SnO2 sensors, compatible with Si technology, is described. The fabrication procedure consists of deposition and patterning of Pt heating elements and sensor contact pads. The SnO2 sensing element is formed through a new sol-gel method exploiting a lift-off step for patterning. Sintering of the sensor at a temperature of 600°C finalizes the fabrication. Preliminary results of sensor characteristics are reported. In addition, the behaviour of SnO2 sensors fabricated using a pressed-pallet method with anomalous characteristics is addressed. The temperature-dependent response of SnO2-based sensors as a λ-ratio sensing device is reported. A low-high transition in the sensor conductivity, occurring at a ratio of combustible to oxygen gases away from the stoichiometric value, is reported for the first time. The ratio at which this transition arises, happens at values higher than the stoichiometric point for CO and by raising the temperature, it moves towards the stoichiometric point. This phenomenon is reversed for C2H6.
Keywords :
electrical conductivity transitions; gas sensors; microsensors; photolithography; semiconductor materials; sintering; sol-gel processing; tin compounds; λ-ratio sensing device; 600 C; C2H6; CO; CO detection; Pt; Pt heating element patterning; Si; Si technology compatibility; SnO2; combustible gas; ethane; gas sensor; lift-off step; low-high transition; miniaturized SnO2 sensors; pressed-pallet method; sensor contact pads; sintering; sol-gel fabrication; stoichiometric point; temperature-dependent response; temperature-tailored lambda-ratio sensors; Crystallization; Displays; Optical films; Optical sensors; Silicon; Substrates; Surface morphology; Surface treatment; Temperature sensors; X-ray scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronics, 2001. ICM 2001 Proceedings. The 13th International Conference on
Print_ISBN :
0-7803-7522-X
Type :
conf
DOI :
10.1109/ICM.2001.997494
Filename :
997494
Link To Document :
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