• DocumentCode
    2444733
  • Title

    Single Event Upset Characterization of the TMS320C6713 Digital Signal Processor Using Proton Irradiation

  • Author

    Hiemstra, David M.

  • Author_Institution
    MDA, Brampton, ON, Canada
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    133
  • Lastpage
    135
  • Abstract
    The proton induced SEU cross-section of the TMS320C6713 digital signal processor´s functional blocks are presented. The cross-sections are used to estimate the upset rates in the space radiation environment.
  • Keywords
    CMOS integrated circuits; digital signal processing chips; integrated circuit testing; proton effects; radiation hardening (electronics); spacecraft computers; SEU cross-section; TMS320C6713 digital signal processor; critical computer systems; functional blocks; proton irradiation; radiation hardening; single event upset; space radiation environment; Circuit testing; Digital signal processing; Digital signal processors; Logic devices; Logic testing; Performance evaluation; Protons; Random access memory; SDRAM; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2009 IEEE
  • Conference_Location
    Quebec City, QC
  • Print_ISBN
    978-1-4244-5092-3
  • Type

    conf

  • DOI
    10.1109/REDW.2009.5336300
  • Filename
    5336300
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2444733