Title :
Ricean K-Factor Measurements and Analysis for Wideband Radio Channels in High-Speed Railway U-Shape Cutting Scenarios
Author :
Tao Zhou ; Cheng Tao ; Liu Liu ; Zhenhui Tan
Author_Institution :
Inst. of Broadband Wireless Mobile Commun., Beijing Jiaotong Univ., Beijing, China
Abstract :
Based on wideband radio channel measurements with a bandwidth of up to 50 MHz at 2.35 GHz in a U-shape cutting environment, we analyze the Ricean K-factor for high-speed railway communications. Three types of the K-factor, consisting of narrowband, wideband and delay K-factor, are extracted according to the measured channel responses by using the channel partitioning and combining method. Due to the rich reflecting and scattering components in the U-shape cutting scenario, the K-factor dramatically changes with the frequency. A distance-based statistical narrowband K-factor model covering the frequency variability is proposed. The channel bandwidth dependent property of the wideband K-factor is observed and then a bandwidth-based statistical wideband K-factor model is developed. Moreover, it is found that the K-factor just exists at the beginning of the delay bins in the deep U-shape cutting scenario. These results are provided for use in system design and channel modeling of high-speed railway communications.
Keywords :
Rician channels; railway communication; statistical analysis; Ricean K-factor measurements; bandwidth-based statistical wideband K-factor model; channel bandwidth dependent property; channel combining method; channel modeling; channel partitioning method; delay K-factor; distance-based statistical narrowband K-factor model; frequency 2.35 GHz; frequency variability; high-speed railway U-shape cutting scenarios; high-speed railway communications; measured channel responses; system design; wideband radio channel analysis; wideband radio channel measurements; Antenna measurements; Delays; Frequency measurement; Narrowband; Rail transportation; Wideband;
Conference_Titel :
Vehicular Technology Conference (VTC Spring), 2014 IEEE 79th
Conference_Location :
Seoul
DOI :
10.1109/VTCSpring.2014.7023077