• DocumentCode
    2444929
  • Title

    Single Event Effects in MEMS Accelerometers

  • Author

    Oudea, Coumar ; Poirot, Patrick ; Gaillard, Rémi ; Poivey, Christian ; Marchand, Laurent

  • Author_Institution
    EADS-Astrium Space Transp., Les Mureaux, France
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    94
  • Lastpage
    98
  • Abstract
    We present single event effects, induced by heavy ions and protons, on a COTS MEMS accelerometer. The testing procedure is outlined and the contributions from different parts of the accelerometer are discussed.
  • Keywords
    accelerometers; aerospace instrumentation; ion beam effects; micromechanical devices; proton effects; radiation hardening (electronics); COTS MEMS accelerometer; heavy ion effect; proton effect; single event effects; spacecraft design application; Acceleration; Accelerometers; Application specific integrated circuits; Microcontrollers; Micromechanical devices; Packaging; Protons; Telephony; Temperature sensors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2009 IEEE
  • Conference_Location
    Quebec City, QC
  • Print_ISBN
    978-1-4244-5092-3
  • Type

    conf

  • DOI
    10.1109/REDW.2009.5336309
  • Filename
    5336309
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2444929