Title :
Single Event Effects in MEMS Accelerometers
Author :
Oudea, Coumar ; Poirot, Patrick ; Gaillard, Rémi ; Poivey, Christian ; Marchand, Laurent
Author_Institution :
EADS-Astrium Space Transp., Les Mureaux, France
Abstract :
We present single event effects, induced by heavy ions and protons, on a COTS MEMS accelerometer. The testing procedure is outlined and the contributions from different parts of the accelerometer are discussed.
Keywords :
accelerometers; aerospace instrumentation; ion beam effects; micromechanical devices; proton effects; radiation hardening (electronics); COTS MEMS accelerometer; heavy ion effect; proton effect; single event effects; spacecraft design application; Acceleration; Accelerometers; Application specific integrated circuits; Microcontrollers; Micromechanical devices; Packaging; Protons; Telephony; Temperature sensors; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336309
