Title :
Power Dependence of Aging in SAW Resonators
Author :
Shreve, W.R. ; Bray, R.C. ; Elliott, S. ; Chu, Y.C.
Keywords :
Acoustic testing; Acoustic waves; Aging; Aluminum; Circuit testing; Copper; Frequency; Oscillators; Stress; Surface acoustic waves;
Conference_Titel :
1981 Ultrasonics Symposium
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/ULTSYM.1981.197588
