Title :
Variably inclined continuous transverse stub-2 antenna
Author :
Sikina, Thomas ; McKay, Douglas ; Komisarek, Kenneth ; Porter, Bradley
Author_Institution :
Raytheon Co., Sudbury, MA, USA
Abstract :
The variably inclined continuous transverse stub (VICTS) technology, especially in its second-generation antenna shows exceptional promise as a low-cost, high-performance alternative to traditional phased arrays in advanced communications applications. VICTS technology was invented and developed by Raytheon (W. W. Milroy) as an outgrowth of work conducted on continuous transverse stub (CTS) radiators. In its basic form (VICTS-1), a series of long, wideband slots is excited by a parallel plate feed network. Elevation scanning is accomplished via the independent rotation (inclination) of the slots with respect to the feed, and azimuth scanning is accomplished by rotating the feed and radiation layers together in a θ-Φ spherically scanned system. The VICTS-2 antenna is therefore a low profile, planar, electro-mechanically-scanned, broadband passive phased array whose simple design translates into low-cost production, high-reliability, and low-loss antennas. This paper describes the key antenna technologies that support the second generation VICTS-2 antenna (Thomas V. Sikina). The antenna´s reliance on broadband antenna and component technologies in a true-time delay and polarization diverse system is largely unique.
Keywords :
antenna phased arrays; antenna radiation patterns; broadband antennas; delays; planar antenna arrays; &thetas;-Φ spherically scanned system; VICTS technology; advanced communications applications; azimuth scanning; broadband passive phased array; electromechanically-scanned array; elevation scanning; polarization diverse system; radiation layers; time delay systems; variably inclined continuous transverse stub-2 antenna; Antenna accessories; Antenna arrays; Azimuth; Broadband antennas; Delay; Feeds; Phased arrays; Polarization; Production; Wideband;
Conference_Titel :
Phased Array Systems and Technology, 2003. IEEE International Symposium on
Print_ISBN :
0-7803-7827-X
DOI :
10.1109/PAST.2003.1257021