• DocumentCode
    2445052
  • Title

    Single Event Transient (SET) Response of National Semiconductor´s ELDRS-Free LM139 Quad Comparator

  • Author

    Kruckmeyer, Kirby ; Buchner, Stephen P. ; DasGupta, Sandeepan

  • Author_Institution
    Nat. Semicond., Santa Clara, CA, USA
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    65
  • Lastpage
    70
  • Abstract
    Heavy ion and pulsed laser Single Event Transient (SET) data are presented for National Semiconductor´s LM139AxLQMLV (5692R9673802VxA). The SET signatures for this part are compared to older versions of the part. The results confirm complications in performing SET testing on bipolar analog products reported by others plus raise new considerations when evaluating SET test results.
  • Keywords
    aerospace instrumentation; bipolar analogue integrated circuits; comparators (circuits); integrated circuit testing; radiation hardening (electronics); 5692R9673802VxA; LM139AxLQMLV; National Semiconductor´s ELDRS-free LM139 quad comparator; SET testing; bipolar analog products; heavy ion SET; pulsed laser SET; single event transient response; space environment; Assembly; Fabrication; Manufacturing processes; Optical pulses; Packaging; Power supplies; Resistors; Semiconductor device manufacture; Semiconductor lasers; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2009 IEEE
  • Conference_Location
    Quebec City, QC
  • Print_ISBN
    978-1-4244-5092-3
  • Type

    conf

  • DOI
    10.1109/REDW.2009.5336313
  • Filename
    5336313
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2445052