Behavioral testability and test pattern generation of the Hopfield network model

The problem of testability and test pattern generation at the highest abstraction level, i.e., based on the network´s behavior, is considered for Hopfield networks. Complete testability is proved. A test pattern generation approach based on creation of an equivalent finite state machine is presented, the functional test pattern generation have been proved to allow very high coverage of logic-level faults in the case of finite state machines. An efficient algorithm, using BDDs, is finally described