• DocumentCode
    2445135
  • Title

    TID and SEE Characterizations of New Radiation-Hardened Bipolar Operational Amplifiers

  • Author

    Chaumont, Géraldine ; Cornanguer, Benoît ; Briand, Patrick ; Prugne, Christophe ; Malou, Florence

  • Author_Institution
    STMicroelectronics, Rennes, France
  • fYear
    2009
  • fDate
    20-24 July 2009
  • Firstpage
    42
  • Lastpage
    46
  • Abstract
    New radiation-hardened operational amplifiers have been ELDRS and SEE characterized. This paper presents the TID results at high and low dose rates up to 300 krad(Si) and the SEE test results.
  • Keywords
    aerospace instrumentation; operational amplifiers; radiation hardening (electronics); ELDRS; SEE; TID; radiation absorbed dose 300 krad; radiation-hardened bipolar operational amplifiers; single event effect; space applications; total ionizing dose; Bandwidth; Current supplies; Helium; Operational amplifiers; Performance evaluation; Pins; Space technology; Temperature; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2009 IEEE
  • Conference_Location
    Quebec City, QC
  • Print_ISBN
    978-1-4244-5092-3
  • Type

    conf

  • DOI
    10.1109/REDW.2009.5336317
  • Filename
    5336317
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2445135