Title :
TID and SEE Characterizations of New Radiation-Hardened Bipolar Operational Amplifiers
Author :
Chaumont, Géraldine ; Cornanguer, Benoît ; Briand, Patrick ; Prugne, Christophe ; Malou, Florence
Author_Institution :
STMicroelectronics, Rennes, France
Abstract :
New radiation-hardened operational amplifiers have been ELDRS and SEE characterized. This paper presents the TID results at high and low dose rates up to 300 krad(Si) and the SEE test results.
Keywords :
aerospace instrumentation; operational amplifiers; radiation hardening (electronics); ELDRS; SEE; TID; radiation absorbed dose 300 krad; radiation-hardened bipolar operational amplifiers; single event effect; space applications; total ionizing dose; Bandwidth; Current supplies; Helium; Operational amplifiers; Performance evaluation; Pins; Space technology; Temperature; Testing; Voltage;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336317
