Title :
Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA
Author :
Cochran, Donna J. ; Buchner, Stephen P. ; Chen, Dakai ; Kim, Hak S. ; LaBel, Kenneth A. ; Oldham, Timothy R. ; Campola, Michael J. ; O´Bryan, Martha V. ; Ladbury, Raymond L. ; Marshall, Cheryl ; Sanders, Anthony B. ; Xapsos, Michael A.
Author_Institution :
NASA Goddard Space Flight Center (GSFC), MEI Technol. Inc., Greenbelt, MD, USA
Abstract :
Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.
Keywords :
aerospace instrumentation; bipolar analogue integrated circuits; digital circuits; hybrid integrated circuits; optoelectronic devices; radiation effects; NASA; analog devices; candidate spacecraft electronics; digital devices; displacement damage compendium; hybrid devices; linear bipolar devices; optoelectronics; total ionizing dose; Aerospace electronics; Application specific integrated circuits; Electronic equipment testing; NASA; Performance evaluation; Protons; Space technology; Space vehicles; Test facilities; USA Councils;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336318
