Total Ionizing Dose and Displacement Damage Compendium of Candidate Spacecraft Electronics for NASA

Author

Cochran, Donna J. ; Buchner, Stephen P. ; Chen, Dakai ; Kim, Hak S. ; LaBel, Kenneth A. ; Oldham, Timothy R. ; Campola, Michael J. ; O´Bryan, Martha V. ; Ladbury, Raymond L. ; Marshall, Cheryl ; Sanders, Anthony B. ; Xapsos, Michael A.

Author_Institution

NASA Goddard Space Flight Center (GSFC), MEI Technol. Inc., Greenbelt, MD, USA

fYear

2009

fDate

20-24 July 2009

Firstpage

25

Lastpage

31

Abstract

Vulnerability of a variety of candidate spacecraft electronics to total ionizing dose and displacement damage is studied. Devices tested include optoelectronics, digital, analog, linear bipolar devices, and hybrid devices.

Keywords

aerospace instrumentation; bipolar analogue integrated circuits; digital circuits; hybrid integrated circuits; optoelectronic devices; radiation effects; NASA; analog devices; candidate spacecraft electronics; digital devices; displacement damage compendium; hybrid devices; linear bipolar devices; optoelectronics; total ionizing dose; Aerospace electronics; Application specific integrated circuits; Electronic equipment testing; NASA; Performance evaluation; Protons; Space technology; Space vehicles; Test facilities; USA Councils;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2009 IEEE

Conference_Location

Quebec City, QC

Print_ISBN

978-1-4244-5092-3

Type

conf

DOI

10.1109/REDW.2009.5336318

Filename

5336318