Title :
Compendium of Recent Total Ionizing Dose Test Results Conducted by the Jet Propulsion Laboratory from 2003 through 2009
Author :
Kenna, Aaron J. ; Rax, Bernard G. ; Thorbourn, Dennis O. ; Harris, Richard D. ; McClure, Steven S.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Total Ionizing Dose (TID) and Enhanced Low Dose Rate Sensitivity (ELDRS) tests are being performed at the Jet Propulsion Laboratory on a continual basis to support various upcoming space missions and research and development projects. This compendium summarizes the results of the tests carried out over the last six years.
Keywords :
integrated circuit testing; radiation hardening (electronics); semiconductor device testing; space vehicle electronics; ELDRS test; Jet Propulsion Laboratory; TID test; enhanced low dose rate sensitivity test; radiation hardening; space missions; total ionizing dose test; Circuit testing; Ionizing radiation; Laboratories; Microelectronics; NASA; Propulsion; Space missions; Space technology; Telephony; Temperature sensors;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336319
