Title :
Guide to the 2008 IEEE Radiation Effects Data Workshop Record
Author :
Hiemstra, David M.
Author_Institution :
MDA Space Missions, Brampton, ON, Canada
Abstract :
The 2008 Workshop Record has been reviewed and a table prepared to facilitate the search for radiation response data by part number, type, or effect.
Keywords :
integrated circuit testing; radiation effects; semiconductor device testing; 2008 IEEE Radiation Effects Data Workshop Record guide; cumulative index number; part number; part type; radiation effect test environments; radiation effect test facilities; radiation effect test standards; radiation response data;
Conference_Titel :
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location :
Quebec City, QC
Print_ISBN :
978-1-4244-5092-3
DOI :
10.1109/REDW.2009.5336322
