DocumentCode
2445264
Title
Compendium of Total Ionizing Dose Radiation Test Results from Ball Aerospace & Technologies Corp.
Author
Bird, John M. ; Davies, Rob ; Scott, Katherine ; Evans, Jake ; Cabanas-Holmen, Manuel ; Morris, Ty
Author_Institution
Ball Aerosp. & Technol. Corp., Boulder, CO, USA
fYear
2009
fDate
20-24 July 2009
Firstpage
6
Lastpage
11
Abstract
A number of electronic devices have been tested for sensitivity to total ionizing dose for space applications at Ball Aerospace & Technologies Corp. Test results are presented for optoelectronics, digital, analog, mixed signal, and hybrid devices.
Keywords
aerospace instrumentation; analogue integrated circuits; digital integrated circuits; dosimetry; hybrid integrated circuits; mixed analogue-digital integrated circuits; optoelectronic devices; radiation hardening (electronics); TID testing; aerospace technology; analog devices; digital devices; electronic devices; hybrid devices; mixed signal devices; optoelectronics; space applications; total ionizing dose radiation test; Aerospace testing; Birds; Degradation; Electronic equipment testing; Ionizing radiation; Laboratories; Light emitting diodes; Performance evaluation; Personal communication networks; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2009 IEEE
Conference_Location
Quebec City, QC
Print_ISBN
978-1-4244-5092-3
Type
conf
DOI
10.1109/REDW.2009.5336323
Filename
5336323
Link To Document