Title :
Millimeter-wave deembedding using the extended TRL (ETRL) approach
Author :
Herman, M.I. ; Pao, C.K. ; Lan, G.L. ; Chen, J.C.
Author_Institution :
Hughes Aircraft Co., Torrance, CA, USA
Abstract :
A novel approach for deembedding is presented which utilizes known physical transmission line lengths instead of electrical characteristics for calibration standards. This allows one to perform millimeter-wave deembedding for waveguide-based vector network analyzers. Theoretical formulation of ETRL and experimental characterization for V-band microstrip lines are shown. Important design guidelines, and selection of valid root choice of the formulation are described.<>
Keywords :
MMIC; calibration; integrated circuit testing; microwave measurement; network analysers; strip lines; ETRL; MMIC testing; V-band microstrip lines; calibration standards; design guidelines; extended TRL; millimeter-wave deembedding; physical transmission line lengths; root selection; thru-reflect-line; waveguide-based vector network analyzers; Aircraft; Circuit testing; Delay; Equations; Fixtures; Guidelines; MMICs; Millimeter wave technology; Reflection; Strips;
Conference_Titel :
Microwave Symposium Digest, 1990., IEEE MTT-S International
Conference_Location :
Dallas, TX
DOI :
10.1109/MWSYM.1990.99756
