DocumentCode :
24457
Title :
A Future Way of Storing Information: Resistive Random Access Memory.
Author :
Yanfeng Ji ; Jianchen Hu ; Lanza, Mario
Author_Institution :
Inst. of Functional Nano & Soft Mater., Soochow Univ., Suzhou, China
Volume :
9
Issue :
1
fYear :
2015
fDate :
Mar-15
Firstpage :
12
Lastpage :
17
Abstract :
Electronic information storage has become one of the major needs of modern societies, and it represents a market of more than US$5 billion [1]. Among all of the existing technologies, flash memory is the most widespread because of its simple structure, high integration, and fast speed [2]. The core cell of this device is based on the charge and discharge of a capacitor using a transistor as a tiny switch [3], but, as the devices are scaled down, this configuration presents some physical limitations [4]. Therefore, new ways for information storage are required, and, among all existing nonvolatile memories, one that has raised major expectations in recent years is resistive random access memory (RRAM) [5]. In this article, we present the working principle and functioning of the most promising RRAM devices for future information storage.
Keywords :
flash memories; information storage; resistive RAM; RRAM device; capacitor discharge; core cell; electronic information storage; flash memory; nonvolatile memory; resistive random access memory; transistor; Capacitors; Consumer electronics; DIscharges (electric); Electrodes; Hafnium compounds; Nanoscale devices; Nonvolatile memory; Switching circuits;
fLanguage :
English
Journal_Title :
Nanotechnology Magazine, IEEE
Publisher :
ieee
ISSN :
1932-4510
Type :
jour
DOI :
10.1109/MNANO.2014.2373402
Filename :
7012100
Link To Document :
بازگشت