• DocumentCode
    24457
  • Title

    A Future Way of Storing Information: Resistive Random Access Memory.

  • Author

    Yanfeng Ji ; Jianchen Hu ; Lanza, Mario

  • Author_Institution
    Inst. of Functional Nano & Soft Mater., Soochow Univ., Suzhou, China
  • Volume
    9
  • Issue
    1
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    12
  • Lastpage
    17
  • Abstract
    Electronic information storage has become one of the major needs of modern societies, and it represents a market of more than US$5 billion [1]. Among all of the existing technologies, flash memory is the most widespread because of its simple structure, high integration, and fast speed [2]. The core cell of this device is based on the charge and discharge of a capacitor using a transistor as a tiny switch [3], but, as the devices are scaled down, this configuration presents some physical limitations [4]. Therefore, new ways for information storage are required, and, among all existing nonvolatile memories, one that has raised major expectations in recent years is resistive random access memory (RRAM) [5]. In this article, we present the working principle and functioning of the most promising RRAM devices for future information storage.
  • Keywords
    flash memories; information storage; resistive RAM; RRAM device; capacitor discharge; core cell; electronic information storage; flash memory; nonvolatile memory; resistive random access memory; transistor; Capacitors; Consumer electronics; DIscharges (electric); Electrodes; Hafnium compounds; Nanoscale devices; Nonvolatile memory; Switching circuits;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1932-4510
  • Type

    jour

  • DOI
    10.1109/MNANO.2014.2373402
  • Filename
    7012100