DocumentCode :
2446532
Title :
GROWTH AND CHARACTERIZATION OF REACTIVELY SPUTTERED TUNNEL JUNCTIONS
Author :
Smith, Dante J. ; Platt, Christopher L. ; Berkowitz, Ami E.
Author_Institution :
Arizona State University
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
150
Lastpage :
150
Keywords :
Atomic force microscopy; Atomic measurements; Fluctuations; Force measurement; Insulation; Magnetic domains; Magnetic separation; Magnetic tunneling; Reproducibility of results; Tunneling magnetoresistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.737320
Filename :
737320
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2446532
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