DocumentCode :
2446599
Title :
Effect of Nickel Film Thickness on the Attenuation of SAW
Author :
Yoshida, Hajime ; Lee, Guo-Tai ; Xu, Mu Liang ; Levy, Moises
fYear :
1981
fDate :
14-16 Oct. 1981
Firstpage :
479
Lastpage :
482
Keywords :
Attenuation; Delay lines; Magnetic field measurement; Magnetic fields; Magnetic films; Nickel; Optical films; Piezoelectric films; Substrates; Surface acoustic waves;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
1981 Ultrasonics Symposium
Conference_Location :
Chicago, IL, USA
Type :
conf
DOI :
10.1109/ULTSYM.1981.197667
Filename :
1534607
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2446599
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