Title :
Sputtered AlN Films for Bulk-Acoustic-Wave Devices
Author :
Wang, J.S. ; Lakin, K.M.
Keywords :
Acoustic measurements; Film bulk acoustic resonators; Frequency; Nitrogen; Piezoelectric films; Plasma devices; Plasma temperature; Semiconductor films; Sputtering; Substrates;
Conference_Titel :
1981 Ultrasonics Symposium
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/ULTSYM.1981.197672