• DocumentCode
    2446732
  • Title

    Magnetic Force Microscopy Study of Sources of Risidual Overwrite Signal in Longitudinal Thim Film Magnetic Recording Media

  • Author

    Schabes, M.E. ; Mei, Lin ; Yeh, N.H.

  • Author_Institution
    Komag Inc.
  • fYear
    1998
  • fDate
    6-9 Jan. 1998
  • Firstpage
    154
  • Lastpage
    155
  • Keywords
    Finite element methods; Frequency; Magnetic analysis; Magnetic field measurement; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic recording; Magnetization; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-5118-5
  • Type

    conf

  • DOI
    10.1109/INTMAG.1998.737331
  • Filename
    737331