DocumentCode :
2446736
Title :
Coverage Driven Test Generation Framework for RTL Functional Verification
Author :
Guo, Yang ; Qu, Wanxia ; Li, Tun ; Li, Sikun
Author_Institution :
Nat. Univ. of Defense Technol., Changsha
fYear :
2007
fDate :
15-18 Oct. 2007
Firstpage :
321
Lastpage :
326
Abstract :
Functional verification is widely recognized as the bottleneck of the hardware design cycle. The coverage-driven verification approach makes coverage the core engine that drives the whole verification flow, which enables reaching high quality verification in a timely manner. In this paper, we present a coverage driven test generation methodology and a set of tools. We present a novel method for automatic generating simulation vectors from HDL descriptions based on path coverage and constraint solving. We present a novel approach to generate functional vectors based on assertions for RTL design verification. Our approach combines program-slicing based design extraction, word-level SAT and dynamic searching techniques. We also present a coverage analysis method based on VCD file, which only replaying the simulation of the control statements in the HDL description. Experimental results show the efficiency of our methodology.
Keywords :
constraint handling; formal verification; hardware description languages; program slicing; HDL descriptions; RTL functional verification; automatic generating simulation vectors; constraint solving; hardware design; path coverage; program slicing; test generation; Algorithm design and analysis; Analytical models; Bayesian methods; Degradation; Engines; Genetic algorithms; Hardware design languages; Performance analysis; Testing; Time to market;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design and Computer Graphics, 2007 10th IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-1579-3
Electronic_ISBN :
978-1-4244-1579-3
Type :
conf
DOI :
10.1109/CADCG.2007.4407902
Filename :
4407902
Link To Document :
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