Title :
A novel universal battery charger for NiCd, NiMH, Li-ion and Li-polymer
Author :
Lima, F. ; Ramalho, J.N. ; Tavares, D. ; Duarte, J. ; Albuquerque, C. ; Marques, T. ; Geraldes, A. ; Casimiro, A.P. ; Renkema, G. ; Been, J. ; Groeneveld, W.
Author_Institution :
Microelectron. SA, Chipidea, Porto Salvo, Portugal
Abstract :
A universal monolithic battery charger is presented, capable of automatically detecting the number and type of battery cells, NiCd, NiMH, Li-ion and Li-polymer. Different charging modes are supported from constant-current voltage-limited to constant-voltage current-limited with a wide range of charging rates, current or voltage limitations. A novel control using continuous and switched loops regulates the current and voltage concurrently during the various phases of the charging process. In addition, various end-of-charge detections are available, namely the detection of residual charging current for Lithium batteries, peak voltage for Nickel batteries, and safety detections including under and over voltage and temperature, and time-out detection. The charger IC is implemented in a 5V, 0.5/spl mu/m triple-metal standard CMOS process, requiring 8 pins and a total silicon area of 3mm/sup 2/. Three external resistors and a charging transistor complete the charger.
Keywords :
CMOS integrated circuits; battery charge measurement; battery chargers; monolithic integrated circuits; secondary cells; 0.5 microns; 5 V; Li; Li-ion battery; Li-polymer battery; Lithium batteries; NiCd; Nickel batteries; automatic detection; battery cells; charger IC; charging process; charging rates; constant-current voltage-limited mode; constant-voltage current-limited mode; continuous loops; current limitations; different charging modes; end-of-charge detections; monolithic battery charger; over voltage detection; peak voltage detection; residual charging current; safety detections; standard CMOS process; switched loops; temperature detection; time-out detection; under voltage detection; universal battery charger; voltage limitations; Batteries; CMOS integrated circuits; CMOS process; Lithium; Nickel; Pins; Safety; Silicon; Temperature; Voltage control;
Conference_Titel :
Solid-State Circuits Conference, 2003. ESSCIRC '03. Proceedings of the 29th European
Conference_Location :
Estoril, Portugal
Print_ISBN :
0-7803-7995-0
DOI :
10.1109/ESSCIRC.2003.1257109
