• DocumentCode
    2446751
  • Title

    Classificable and Quantitative MFM Study on Partial Erasure Behavior of Longitudinal Recording

  • Author

    Taguchi, T.K. ; Takeo, Akihiko ; Tanaka, Yuichi

  • Author_Institution
    Toshiba R&D Ctr.
  • fYear
    1998
  • fDate
    6-9 Jan. 1998
  • Firstpage
    155
  • Lastpage
    155
  • Keywords
    Analytical models; Finite element methods; Magnetic analysis; Magnetic field measurement; Magnetic force microscopy; Magnetic hysteresis; Magnetic recording; Magnetization; Research and development; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-5118-5
  • Type

    conf

  • DOI
    10.1109/INTMAG.1998.737332
  • Filename
    737332