DocumentCode :
2446751
Title :
Classificable and Quantitative MFM Study on Partial Erasure Behavior of Longitudinal Recording
Author :
Taguchi, T.K. ; Takeo, Akihiko ; Tanaka, Yuichi
Author_Institution :
Toshiba R&D Ctr.
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
155
Lastpage :
155
Keywords :
Analytical models; Finite element methods; Magnetic analysis; Magnetic field measurement; Magnetic force microscopy; Magnetic hysteresis; Magnetic recording; Magnetization; Research and development; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.737332
Filename :
737332
Link To Document :
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