DocumentCode
2446931
Title
Dielectric loaded HTS resonators as frequency standards and low phase noise oscillators
Author
Gallop, J.C. ; Langham, C.D. ; Abbas, F.
Author_Institution
Nat. Phys. Lab., Teddington, UK
fYear
1996
fDate
17-21 June 1996
Firstpage
281
Lastpage
282
Abstract
We assess the potential for HTS dielectric loaded resonators as practical frequency standards and reference elements for low phase noise oscillators.
Keywords
Q-factor; frequency measurement; frequency stability; high-temperature superconductors; measurement standards; microwave measurement; microwave oscillators; phase noise; superconducting cavity resonators; superconducting device noise; 4.2 K; cryogenic temperature stability; dielectric loaded HTSC resonators; frequency stability; frequency standards; loss tangent; low phase noise oscillators; microwave frequencies; quality factor; reference elements; relative permittivity; surface impedance; temperature dependence; Dielectric loss measurement; Dielectric losses; High temperature superconductors; Oscillators; Phase noise; Resonant frequency; Stability; Superconducting device noise; Superconducting microwave devices; Surface impedance;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location
Braunschweig, Germany
Print_ISBN
0-7803-3376-4
Type
conf
DOI
10.1109/CPEM.1996.547072
Filename
547072
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