• DocumentCode
    2446953
  • Title

    Design and verification of distributed industrial manufacturing control systems

  • Author

    Hirsch, Martin ; Missal, Dirk ; Hanisch, Hans-Michael

  • Author_Institution
    Martin Luther Univ. of Halle, Halle
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    152
  • Lastpage
    157
  • Abstract
    Just now, there are numerous challenges in the automation technology sector, regarding such key words like distribution and easy reconfiguration of systems. But also other engineering areas, e.g. the traditional embedded systems domain, often suffer from malfunctions due to increasing distribution and therefore, increasing complexity. Malfunctions in these areas mostly occur because of suboptimal requirements engineering, including the usage of inconsistent specifications, and no verification of the control software. The conclusion is to optimize the requirements engineering/specifications along with adequate means and to apply formal verification methods with well fitting system description opportunities. Another aspect is to use means for generic higher level system description, which supports such features like distribution, reconfiguration, reusability and interoperability. Therefore, in this paper an engineering framework is introduced, which covers the mentioned issues above.
  • Keywords
    formal verification; industrial control; manufacturing systems; open systems; software reusability; automation technology; distributed industrial manufacturing control systems; embedded systems; formal verification methods; interoperability; requirements engineering; suboptimal requirements engineering; Automatic control; Control systems; Distributed control; Electrical equipment industry; Embedded system; Formal verification; Industrial control; Manufacturing automation; Manufacturing industries; Optimization methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4757944
  • Filename
    4757944