DocumentCode :
2446988
Title :
Digital circuit capacitance and switching analysis for ground bounce in ICs with a high-ohmic substrate
Author :
Badaroglu, Mustafa ; Balasubramanian, Lakshmanan ; Tiri, Kris ; Gravot, Vincent ; Wambacq, Piet ; Van der Plas, G. ; Donnay, Stéphane ; Gielen, Georges ; De Man, Hugo
Author_Institution :
IMEC, Leuven, Belgium
fYear :
2003
fDate :
16-18 Sept. 2003
Firstpage :
257
Lastpage :
260
Abstract :
Ground bounce is a major contributor to substrate noise generation due to the resonance caused by the inductance and the VDD-VSS admittance that consists of the on-chip digital circuit capacitance of the MOS transistors, the decoupling, and the parasitics arising from the interconnect. This paper addresses (1) the dependence of the VDD-VSS admittance on the different states of the circuit and the interconnect, and (2) the computation of total supply current with ground bounce. The VDD-VSS admittances of several test circuits are computed with 13% maximum error relative to the measurements on a test ASIC fabricated in a 0.18/spl mu/m CMOS process on a high-ohmic substrate with 18/spl Omega/cm resistivity. It is also shown that this admittance depends on the connectivity of the gates to the supply rail rather than their connectivity among each other.
Keywords :
CMOS integrated circuits; application specific integrated circuits; capacitance; circuit analysis computing; circuit resonance; integrated circuit interconnections; integrated circuit noise; substrates; switching; 0.18 microns; CMOS process; IC; MOS transistors; VDD-VSS admittance; gates connectivity; ground bounce; high-ohmic substrate; on-chip digital circuit capacitance; substrate noise generation; supply rail; switching analysis; test ASIC; test circuits; Admittance; Capacitance; Circuit noise; Circuit testing; Digital circuits; Inductance; Integrated circuit interconnections; Noise generators; Resonance; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2003. ESSCIRC '03. Proceedings of the 29th European
Conference_Location :
Estoril, Portugal
Print_ISBN :
0-7803-7995-0
Type :
conf
DOI :
10.1109/ESSCIRC.2003.1257121
Filename :
1257121
Link To Document :
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