Performance analysis and improvement of JPV primality test for smart IC cards

Author

Hosung Jo ; Heejin Park

Author_Institution

Dept. of Electron. & Comput. Eng., Hanyang Univ., Seoul, South Korea

fYear

2014

fDate

15-17 Jan. 2014

Firstpage

271

Lastpage

275

Abstract

JPV algorithm, proposed by Joye et al. was predicted to be faster than the combined prime generation algorithm but it runs slower in practice. This discrepancy is because only the number of Fermat test calls was compared in estimating a total running time. We present a probabilistic analysis on the total running time of JPV algorithm. This analysis is very accurate and corresponds to the experiment with only 1-2% error. Furthermore, we propose an improved JPV algorithm that uses Euclid function. It is faster than JPV algorithm and similar to the combined algorithm with the same space requirement.

Keywords

public key cryptography; smart cards; statistical analysis; Euclid function; Fermat test calls; JPV algorithm; JPV primality test; prime generation algorithm; probabilistic analysis; public-key cryptosystem; smart IC cards; space requirement; Algorithm design and analysis; Probabilistic logic; Public key cryptography; Software algorithms; Time measurement; Tunneling magnetoresistance; Primality test; Prime generation; Public-key cryptosystem;

fLanguage

English

Publisher

ieee

Conference_Titel

Big Data and Smart Computing (BIGCOMP), 2014 International Conference on

Conference_Location

Bangkok

Type

conf

DOI

10.1109/BIGCOMP.2014.6741451

Filename

6741451