DocumentCode
2447675
Title
Testing FPGA based reconfigurable system within run time applications
Author
Doumar, Abderrahim ; Ito, Hideo
Author_Institution
Comput. Lab., Cambridge Univ., UK
fYear
2001
fDate
29-31 Oct. 2001
Firstpage
234
Lastpage
236
Abstract
We introduce a technique for testing partially reconfigurable FPGAs. The test technique is intended to be applied in reconfigurable systems in run time applications. Normally, in reconfigurable systems, each FPGA executes many tasks sequentially. Therefore, it is configured many times in run time applications. We propose that each FPGA is tested just before each configuration. The whole system remains functional because other FPGAs are still in function when the target FPGA is under test. Since the FPGA´s transit time from one task to another has a direct consequence on the system delay, the test must be very fast. Therefore, the test proposed targets only a test of tiles where the majority of the data will be configured and only configurable logic blocks actually used are tested. The technique proposed targets test which is achieved within the fault tolerant system, and is very useful in some critical applications with time and resources constraints.
Keywords
design for testability; fault tolerance; field programmable gate arrays; logic testing; reconfigurable architectures; FPGA based reconfigurable system testing; FPGA transit time; design for testing; fault tolerant system; partially reconfigurable FPGAs; programmability; resources constraint; run time applications; shifting configurations; system functionality; tile test; Application software; Delay effects; Delay systems; EPROM; Fault tolerant systems; Field programmable gate arrays; Hardware; Laboratories; Logic testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, 2001. ICM 2001 Proceedings. The 13th International Conference on
Print_ISBN
0-7803-7522-X
Type
conf
DOI
10.1109/ICM.2001.997653
Filename
997653
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