Title :
Discriminant analysis and adaptive wavelet feature selection for statistical object detection
Author :
Zhu, Ying ; Schwartz, Stuart
Author_Institution :
Dept. of Electr. Eng., Princeton Univ., NJ, USA
Abstract :
We utilize the discriminant analysis to select wavelet features for efficient object detection. The analysis applies to the Bayesian classifier and is extended to the case of boosting. Based on the error analysis under the Bayesian decision rule, we reduce the number of coefficients involved in detection to lower the computational cost. Using a hidden Markov tree model to describe the pattern distributions, we introduce the concept of error-bound-tree to relate feature selection to error reduction. The scheme selects discriminative features that are adaptive to the pattern and allows the detector to reach a decision faster.
Keywords :
Bayes methods; error analysis; feature extraction; object recognition; trees (mathematics); wavelet transforms; Bayesian classifier; Bayesian decision rule; Hidden Markov Tree; adaptive feature selection; error analysis; error bound-tree; pattern distributions; statistical object detection; wavelet features; Bayesian methods; Boosting; Computational complexity; Computational efficiency; Detectors; Error analysis; Face detection; Hidden Markov models; Object detection; Wavelet analysis;
Conference_Titel :
Pattern Recognition, 2002. Proceedings. 16th International Conference on
Print_ISBN :
0-7695-1695-X
DOI :
10.1109/ICPR.2002.1047406