Title :
Experimental and Theoretical Characterization of Near Surface Cracks in Solids by Photoacoustic Microscopy
Author :
Kuo, P.K. ; Inglehart, L.J. ; Favro, L.O. ; Thomas, R.L.
Keywords :
Amplifiers; Gray-scale; Microscopy; Signal analysis; Silicon carbide; Solids; Surface cracks; Temperature; Thermal conductivity; Thermal resistance;
Conference_Titel :
1981 Ultrasonics Symposium
Conference_Location :
Chicago, IL, USA
DOI :
10.1109/ULTSYM.1981.197741
