Experimental and Theoretical Characterization of Near Surface Cracks in Solids by Photoacoustic Microscopy

Author

Kuo, P.K. ; Inglehart, L.J. ; Favro, L.O. ; Thomas, R.L.

fYear

1981

fDate

14-16 Oct. 1981

Firstpage

837

Lastpage

839

Keywords

Amplifiers; Gray-scale; Microscopy; Signal analysis; Silicon carbide; Solids; Surface cracks; Temperature; Thermal conductivity; Thermal resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

1981 Ultrasonics Symposium

Conference_Location

Chicago, IL, USA

Type

DOI

10.1109/ULTSYM.1981.197741

Filename

1534681

Link To Document