DocumentCode
2448204
Title
Trends in testing integrated circuits
Author
Vermeulen, Bart ; Hora, Camelia ; Kruseman, Bram ; Marinissen, Erik Jan ; Van Rijsinge, Robert
Author_Institution
Philips Res. Lab., Eindhoven, Netherlands
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
688
Lastpage
697
Abstract
New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.
Keywords
automatic test equipment; design for testability; electronics industry; integrated circuit technology; integrated circuit testing; Philips; automatic test equipment; customer quality requirements; design complexity; design for testability; electronics industry; integrated circuit process technology; integrated circuit testing; test program development; test quality; Circuit testing; Costs; Integrated circuit technology; Integrated circuit testing; Laboratories; Manufacturing industries; Marine technology; Process design; Semiconductor device testing; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1387330
Filename
1387330
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