• DocumentCode
    2448234
  • Title

    Future trends in test: the adoption and use of low cost structural testers

  • Author

    Crouch, Alfred L.

  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    698
  • Lastpage
    703
  • Abstract
    Recently, low cost and desktop structural testers have become popular for various reasons. Although originally aimed at reducing production test costs, they have quickly migrated to other niches and have proven useful in reducing not only cost, but time-to-market. Tracking the "use" spaces has resulted in identifying three clearly different areas of application: design-desktop, correlation-lab, and the production-test floor. These spaces have defined tasks such as characterization, first silicon bring-up, test program development, yield-learning diagnosis, and production probe, some of which be described as case studies.
  • Keywords
    cost reduction; design for testability; production testing; time to market; desktop structural testers; low cost structural testers; production probe; production test cost reduction; test program development; time to market; yield learning diagnosis; Built-in self-test; Cost function; Design for testability; Electronic equipment testing; Logic testing; Production; Semiconductor device testing; Silicon; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1387331
  • Filename
    1387331