DocumentCode
2448234
Title
Future trends in test: the adoption and use of low cost structural testers
Author
Crouch, Alfred L.
fYear
2004
fDate
26-28 Oct. 2004
Firstpage
698
Lastpage
703
Abstract
Recently, low cost and desktop structural testers have become popular for various reasons. Although originally aimed at reducing production test costs, they have quickly migrated to other niches and have proven useful in reducing not only cost, but time-to-market. Tracking the "use" spaces has resulted in identifying three clearly different areas of application: design-desktop, correlation-lab, and the production-test floor. These spaces have defined tasks such as characterization, first silicon bring-up, test program development, yield-learning diagnosis, and production probe, some of which be described as case studies.
Keywords
cost reduction; design for testability; production testing; time to market; desktop structural testers; low cost structural testers; production probe; production test cost reduction; test program development; time to market; yield learning diagnosis; Built-in self-test; Cost function; Design for testability; Electronic equipment testing; Logic testing; Production; Semiconductor device testing; Silicon; Timing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN
0-7803-8580-2
Type
conf
DOI
10.1109/TEST.2004.1387331
Filename
1387331
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