• DocumentCode
    2448320
  • Title

    Analytical calculation of current and voltage stresses of Two-Stage Matrix Converter’s power semiconductors

  • Author

    Hamouda, Mahmoud ; Fnaiech, Farhat ; Al-Haddad, Kamal

  • Author_Institution
    Equipe SICISI, Ecole Suprieure des Sci. et Tech. de Tunis, Tunis
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    561
  • Lastpage
    566
  • Abstract
    The currentpsilas path through the power semiconductors of matrix converters depends inherently on the load side displacement factor. In principle, two particular cases should be investigated. They correspond to a lagging/leading output displacement angle lower and superior to pi/6 respectively. This paper determines new analytical expressions of the current and voltage stresses of two-stage matrix converterpsilas power semiconductors for a load side lagging/leading displacement angle less than pi/6. The first novelty in the proposed approach is that any assumption which decouples the two stages is adopted. The second one is that the proposed formulas are not restricted to the case of unity input displacement factor i.e. they are available for a variable IDF operation. Besides the well known influence of the input displacement factor on the reactive power demanded from the utility and the maximum achievable voltage transfer ratio, it is shown that this factor also affects the current stress on the power semiconductors. A comparative study carried out between the results of analytical computations and those of numerical simulations shows that the two methods agree well and emphasizing thus the effectiveness and accuracy of the proposed analytical expressions.
  • Keywords
    matrix convertors; power semiconductor devices; current stress; power semiconductors; two-stage matrix converter; voltage stress; Energy conversion; Lead compounds; Matrix converters; Performance analysis; Power electronics; Power semiconductor switches; Reactive power; Stress; Topology; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758015
  • Filename
    4758015