• DocumentCode
    2448932
  • Title

    Uniformity testing using minimal spanning tree

  • Author

    Jain, Anil K. ; Xu, Xiaowei ; Ho, Tin Kam ; Xiao, Fan

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    4
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    281
  • Abstract
    Testing for uniformity of multivariate data is the initial step in exploratory pattern analysis. We propose a new uniformity testing method, which first computes the maximum (standardized) edge length in the MST of the given data. Large lengths indicate the existence of well-separated clusters or outliers in the data. For the data passing this edge inconsistency test, we generate two sub-samples of the data by a weighted re-sampling method, where the weights are computed based on the normalized edge lengths of MST of the entire data. The uniformity of the data is estimated by running the two-sample MST-test on these two sub-samples. Experiments with simulated and real data show the potential of the proposed test in identifying uniform or weakly clustered data. This test can also be used to rank various data sets based on their degree of uniformity.
  • Keywords
    pattern clustering; statistical analysis; trees (mathematics); edge inconsistency test; exploratory pattern analysis; maximum edge length; minimal spanning tree; multivariate data; outliers; uniformity testing; weighted re-sampling method; well-separated clusters; Computational modeling; Computer science; Data engineering; Multidimensional systems; Pattern analysis; Pattern recognition; Sampling methods; Shape; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition, 2002. Proceedings. 16th International Conference on
  • ISSN
    1051-4651
  • Print_ISBN
    0-7695-1695-X
  • Type

    conf

  • DOI
    10.1109/ICPR.2002.1047451
  • Filename
    1047451