• DocumentCode
    2449065
  • Title

    A joint probabilistic data association algorithm for distributed multisensor system in jamming and low-RCS target environment

  • Author

    Hongwei, Cheng ; Longbin, MO ; Zhongkang, Sun

  • Author_Institution
    Inst. of Electron. Eng., Nat. Univ. of Defense Technol., Hunan, China
  • Volume
    2
  • fYear
    1997
  • fDate
    14-18 Jul 1997
  • Firstpage
    1002
  • Abstract
    Conventional target association and tracking techniques such as PDA and JPDA have very fine performance when the measurement acquired from sensors are perfect. However, when jamming and stealth techniques are widely used, it is very difficult for sensors to gain perfect measurements. Though a single sensor in a distributed sensors system might fail to acquire continually perfect measurements of low-RCS (stealth) targets under jamming environment, the distributed sensors system might gain relatively perfect measurements by integrating measurement hits or fractional trajectories of targets from every sensor in the system. The paper discusses association and tracking techniques under the circumstances mentioned above. Special attention is paid to track initiation and data association. Monte Carlo simulation test results are also presented in the paper
  • Keywords
    Hough transforms; digital simulation; jamming; probability; sensor fusion; simulation; tracking; Hough transform; JPDA; Monte Carlo simulation test; PDA; data association; distributed multisensor; distributed sensors; fractional trajectories; jamming; joint probabilistic data association algorithm; low-RCS target environment; measurement hits; model formation; simulation test; stealth; target association; targets; track initiation; Clutter; Gain measurement; Jamming; Multisensor systems; Radar cross section; Radar tracking; Sensor systems; Target tracking; Testing; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace and Electronics Conference, 1997. NAECON 1997., Proceedings of the IEEE 1997 National
  • Conference_Location
    Dayton, OH
  • Print_ISBN
    0-7803-3725-5
  • Type

    conf

  • DOI
    10.1109/NAECON.1997.622767
  • Filename
    622767