DocumentCode :
2449408
Title :
Offset calibrating comparator array for 1.2-V, 6bit, 4-Gsample/s flash ADCs using 0.13/spl mu/m generic CMOS technology
Author :
Okada, Hiroyuki ; Hashimoto, Yasuyuki ; Sakata, Kohji ; Tsukada, Toshiro ; Ishibashi, Koichiro
Author_Institution :
STARC, Yokohama, Japan
fYear :
2003
fDate :
16-18 Sept. 2003
Firstpage :
711
Lastpage :
714
Abstract :
A 1.2-V calibration comparator array for a flash-type ADC has been developed using 0.13/spl mu/m generic CMOS technology. The developed offset calibration technique corrects the offset mismatch better than 6bit resolution. By employing an offset calibration circuit in the comparator array, the comparator array can operate at low supply voltages. To evaluate the comparator array, a-bit flash-type ADC was fabricated that occupies 0.198 mm /sup 2/. With a 1.2-V power supply, it achieves 4.0 GSample/s and consumes 182 mW.
Keywords :
CMOS logic circuits; analogue-digital conversion; calibration; comparators (circuits); integrated circuit design; 0.13 micron; 1.2 V; 182 mW; CMOS technology; comparator array; flash-type ADC; offset calibration circuit; offset mismatch; Analog circuits; Analog-digital conversion; CMOS technology; Calibration; Digital circuits; Dynamic range; Logic arrays; Low voltage; Power supplies; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2003. ESSCIRC '03. Proceedings of the 29th European
Conference_Location :
Estoril, Portugal
Print_ISBN :
0-7803-7995-0
Type :
conf
DOI :
10.1109/ESSCIRC.2003.1257234
Filename :
1257234
Link To Document :
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