DocumentCode
2449470
Title
Electromagnetic analysis of the experimental setup used to investigate the ratchet effect in two-dimensional electron system under microwave radiation
Author
Takacs, A. ; Medhat, D. ; Aubert, H. ; Portal, J.C.
Author_Institution
LAAS, CNRS, Toulouse, France
Volume
1
fYear
2009
fDate
12-14 Oct. 2009
Firstpage
337
Lastpage
340
Abstract
This paper addresses simulation and analysis of the experimental setup for investigation of ratchet effect on semiconductor heterojunctions with periodic array of artificial semi-disc shaped antidots. For the first time, the electromagnetic incident power across the sample is computed here and the uniformity of the incident electric field linear polarization is characterized. These two preliminary full-wave simulation results are very important for characterisation of the next generation of millimeter and sub-millimeter wave electromagnetic detectors based on the ratchet effect in two-dimensional electron system.
Keywords
radiation; semiconductor heterojunctions; semiconductor quantum dots; sensors; simulation; artificial semi-disc shaped antidots; electric field linear polarization; electromagnetic analysis; electromagnetic detectors; electron system; full-wave simulation; microwave radiation; ratchet effect; semiconductor heterojunctions; Analytical models; Computational modeling; Detectors; Electromagnetic analysis; Electromagnetic fields; Electromagnetic radiation; Electromagnetic scattering; Electromagnetic wave polarization; Electrons; Heterojunctions; Ratchet effect; asymmetric antidots; electromagnetic simulations; electron transport;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Conference, 2009. CAS 2009. International
Conference_Location
Sinaia
ISSN
1545-827X
Print_ISBN
978-1-4244-4413-7
Type
conf
DOI
10.1109/SMICND.2009.5336529
Filename
5336529
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