DocumentCode :
2449543
Title :
Throughput optimization for micro-factories subject to task and machine failures
Author :
Benoit, Anne ; Dobrila, Alexandru ; Nicod, Jean-Marc ; Philippe, Laurent
Author_Institution :
LIP Lab., Univ. de Lyon, Lyon, France
fYear :
2010
fDate :
19-23 April 2010
Firstpage :
1
Lastpage :
8
Abstract :
In this paper, we study the problem of optimizing the throughput for micro-factories subject to failures. The challenge consists in mapping several tasks of different types onto a set of machines. The originality of our approach is the failure model for such applications in which not only the machines are subject to failures but the reliability of a task may depend on its type. The failure rate is unrelated: a probability of failure is associated to each couple (task type, machine). We consider different kind of mappings: in one-to-one mappings, each machine can process only a single task, while several tasks of the same type can be processed by the same machine in specialized mappings. Finally, general mappings have no constraints. The optimal one-to-one mapping can be found in polynomial time for particular problem instances, but the problem is NP-hard in most of the cases. For the most realistic case of specialized mappings, which turns out to be NP-hard, we design several polynomial time heuristics and a linear program allows us to find the optimal solution (in exponential time) for small problem instances. Experimental results show that the best heuristics obtain a good throughput, much better than the throughput achieved with a random mapping. Moreover, we obtain a throughput close to the optimal solution in the particular cases where the optimal throughput can be computed.
Keywords :
computational complexity; failure analysis; linear programming; probability; production facilities; NP-hard; exponential time; failure model; failure rate; general mappings; linear program; machine failure; microfactories; one-to-one mappings; polynomial time heuristics; probability; random mapping; task failure; task reliability; throughput optimization; Context modeling; Distributed computing; Humans; Laboratories; Polynomials; Processor scheduling; Production systems; Robotics and automation; Robots; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Parallel & Distributed Processing, Workshops and Phd Forum (IPDPSW), 2010 IEEE International Symposium on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-6533-0
Type :
conf
DOI :
10.1109/IPDPSW.2010.5470829
Filename :
5470829
Link To Document :
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