• DocumentCode
    2449748
  • Title

    Applying PSD Analysis in Ring-Structured-Light 3D Measurement

  • Author

    Huiwen Leng ; Chunguang Xu ; Zhongwei Feng ; Dingguo Xiao

  • Author_Institution
    Sch. of Mech. & Vehicular Eng., Beijing Inst. of Technol., Beijing, China
  • fYear
    2009
  • fDate
    25-26 April 2009
  • Firstpage
    376
  • Lastpage
    380
  • Abstract
    Error elimination is very important in 3D measurement with ring-structured-light. A method has been proposed, which includes the following procedures. First, acquire ring-structured-light images and extract their stripe center. Second, find the base-circle center of the stripe center locus by curve fitting, using the least squares method. Subsequently unfold the stripe center locus along its base-circle. In the waveform of the unfolded view, there exist an eccentricity error component and an ellipse shape error component. The frequencies of these two error components are different from the frequency of detail component. They can be separated in the unfolded view by power spectrum density (PSD) analysis. Based on their formation principles, eccentricity error and ellipse error can be separated and eliminated, and the accuracy of the measurement can be improved. Experiments have demonstrate its applicability.
  • Keywords
    least squares approximations; measurement by laser beam; measurement errors; 3D measurement; PSD analysis; eccentricity error component; least squares method; power spectrum density; ring-structured-light; shape error component; Charge coupled devices; Charge-coupled image sensors; Frequency; Laser beams; Lenses; Mechanical variables measurement; Mirrors; Optical surface waves; Surface emitting lasers; Surface morphology; circle-center position error; computer aided engineering; ellipse error; laser measurement applications; power spectrum density; ring-structured-light;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Artificial Intelligence, 2009. JCAI '09. International Joint Conference on
  • Conference_Location
    Hainan Island
  • Print_ISBN
    978-0-7695-3615-6
  • Type

    conf

  • DOI
    10.1109/JCAI.2009.131
  • Filename
    5159020