Digital synchronization for reconfigurable ATE

Author

West, Bumell G. ; Jones, Michael F.

Author_Institution

Credence, San Jose, CA, USA

fYear

2004

fDate

26-28 Oct. 2004

Firstpage

1249

Lastpage

1254

Abstract

This work introduces a digital synchronization technique for a highly reconfigurable ATE platform that overcomes inherent scaling, multisite, and other limitations in currently used instrument synchronization methods. A new strategy for integrated circuit test synchronisation across several active test and measurement instruments are described. This strategy is much more flexible than currently available star or bus trigger arrangements, and is more accurate as well. The second synchronization mechanism in ATE is a vector synchronisation. The logic to implement the described mechanisms has been successfully implemented in a Xilinx Virtex2 FPGA.

Keywords

automatic test equipment; field programmable gate arrays; integrated circuit testing; synchronisation; Xilinx Virtex2 FPGA; active test instruments; bus trigger arrangement; digital synchronization; instrument synchronization methods; integrated circuit test; measurement instruments; reconfigurable ATE; star trigger arrangement; vector synchronisation; Accuracy; Automatic test equipment; Cables; Costs; Hardware; Instruments; Integrated circuit testing; Multiplexing; System testing; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2004. Proceedings. ITC 2004. International

Print_ISBN

0-7803-8580-2

Type

conf

DOI

10.1109/TEST.2004.1387398

Filename

1387398