• DocumentCode
    2449960
  • Title

    34.1 Gbps low jitter, low BER high-speed parallel CMOS interface for interconnections in high-speed memory test system

  • Author

    Watanabe, Daisuke ; Suda, Masakatsu ; Okayasu, Toshiyulu

  • Author_Institution
    Advantest Corp., Gunma, Japan
  • fYear
    2004
  • fDate
    26-28 Oct. 2004
  • Firstpage
    1255
  • Lastpage
    1262
  • Abstract
    To solve the transmission bottleneck inside ATE systems, we developed a high-speed parallel CMOS interface macro, which is flexibly applicable to ASICs in ATE systems. The interface macro is capable of providing up to 16 TX and/or RX channels: Moreover, multiple macros can be implemented to one chip. The interface macro is capable of transmitting from DC to 34.1 Gbps (2.13 Gbps×16 channels). In order to achieve ultra-low BER, we have developed a low-jitter digital delay locked loop circuit as a 4-phase clock source for SerDes circuits. This solution yields 1.5 ps rms of random jitter. The random jitter of this macro is less than one-eighth of the interface using PLL. The eye-opening reaches 0.7UI at BER=10-19.
  • Keywords
    CMOS memory circuits; application specific integrated circuits; automatic test equipment; clocks; digital phase locked loops; error statistics; jitter; 2.13 Gbit/s; 34.1 Gbit/s; 4 phase clock source; ASIC; ATE systems; PLL; SerDes circuits; high speed memory test system; high speed parallel CMOS interface macro; low jitter digital delay locked loop circuit; receiver channel; transmitter channel; ultralow BER; Amplitude shift keying; Application specific integrated circuits; Bit error rate; Costs; Hardware; Integrated circuit interconnections; Jitter; Random access memory; System testing; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2004. Proceedings. ITC 2004. International
  • Print_ISBN
    0-7803-8580-2
  • Type

    conf

  • DOI
    10.1109/TEST.2004.1387399
  • Filename
    1387399