• DocumentCode
    2450155
  • Title

    J2EE instrumentation for software aging root cause application component determination with AspectJ

  • Author

    Alonso, Javier ; Torres, Jordi ; Berral, Josep Ll ; Gavaldà, Ricard

  • Author_Institution
    Dept. of Comput. Archit., Tech. Univ. of Catalonia, Barcelona, Spain
  • fYear
    2010
  • fDate
    19-23 April 2010
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Unplanned system outages have a negative impact on company revenues and image. While the last decades have seen a lot of efforts from industry and academia to avoid them, they still happen and their impact is increasing. According to many studies, one of the most important causes of these outages is software aging. Software aging phenomena refers to the accumulation of errors, usually provoking resource contention, during long running application executions, like web applications, which normally cause applications/systems hang or crash. Determining the software aging root cause failure, not the resource or resources involved in, is a huge task due to the growing day by day complexity of the systems. In this paper we present a monitoring framework based on Aspect Programming to monitor the resources used by every application component in runtime. Knowing the resources used by every component of the application we can determine which components are related to the software aging. Furthermore, we present a case study where we evaluate our approach to determine in a web application scenario, which components are involved in the software aging with promising results.
  • Keywords
    Java; aspect-oriented programming; software quality; AspectJ; J2EE instrumentation; Web application scenario; aspect programming; software aging; Aging; Application software; Computer architecture; Computer crashes; Condition monitoring; Degradation; Environmental management; Instruments; Programming profession; Runtime;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel & Distributed Processing, Workshops and Phd Forum (IPDPSW), 2010 IEEE International Symposium on
  • Conference_Location
    Atlanta, GA
  • Print_ISBN
    978-1-4244-6533-0
  • Type

    conf

  • DOI
    10.1109/IPDPSW.2010.5470857
  • Filename
    5470857