DocumentCode :
2450647
Title :
Testing a secure device: high coverage with very low observability
Author :
Sourgen, Laurent
Author_Institution :
STMicroelectron., France
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
1415
Abstract :
Secure microcontrollers used in smart card, are small, cost effective, system on chip including a mixtures of standard CPU, memories and dedicated functions added to protect the circuits against leakage or tampering. Testing the device require a high coverage while offering no access to internal information. Today solutions are based on combination of standard structural testing (scan) and functional testing. Both are usually using BIST solutions, based on hardware and firmware implementations. Secure devices includes special antileakage or antitampering dedicated functions.
Keywords :
built-in self test; integrated circuit testing; microcontrollers; system-on-chip; BIST; antileakage dedicated functions; antitampering dedicated functions; circuit protection; functional testing; microcontrollers; scan testing; secure device testing; smart card; standard structural testing; system on chip; Built-in self-test; Central Processing Unit; Circuit testing; Cost function; Hardware; Microcontrollers; Observability; Protection; Smart cards; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1387423
Filename :
1387423
Link To Document :
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