• DocumentCode
    2450676
  • Title

    Novel mathematical formulas for incident and reflected waves for differential mode analysis in long cable ASDs with experimental validations

  • Author

    Amarir, Saïd ; Al-Haddad, Kamal

  • Author_Institution
    Ecole de Technol. Super., Montreal, QC
  • fYear
    2008
  • fDate
    10-13 Nov. 2008
  • Firstpage
    1293
  • Lastpage
    1298
  • Abstract
    This work presents a new computation technique for incident and reflected waves as well as their associated over-voltages and Differential Mode (DM) currents along the Adjustable speed drive (ASD) cable. This method is based on developed mathematical formulas ready for numerical computations. Moreover, it allows simulation of the pulse voltage transients and their DM currents not only at the motor terminals but also at any point along the cable. The developed technique is highly recommended for the investigation of the over-voltage and the conducted EMI, due to the cable length. An approach for measuring required characteristics of the system has also been presented. It has been applied to an industrial 5 kVA ASD prototype using a 4-wire shielded long cable. The paper includes simulation results and experimental validations of the proposed technique.
  • Keywords
    electromagnetic interference; power cables; variable speed drives; 4-wire shielded long cable; apparent power 5 kVA; differential mode analysis; incident waves; long cable adjustable speed drive; mathematical formulas; numerical computations; reflected waves; Cable shielding; Computational modeling; Delta modulation; Electromagnetic interference; Frequency; Insulated gate bipolar transistors; Prototypes; Pulse width modulation; Variable speed drives; Voltage control; Cables; electromagnetic interference (EMI); electromagnetic transient propagation; insulated gate bipolar transistors; over-voltage; pulse width modulation; variable speed drives;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, 2008. IECON 2008. 34th Annual Conference of IEEE
  • Conference_Location
    Orlando, FL
  • ISSN
    1553-572X
  • Print_ISBN
    978-1-4244-1767-4
  • Electronic_ISBN
    1553-572X
  • Type

    conf

  • DOI
    10.1109/IECON.2008.4758141
  • Filename
    4758141