• DocumentCode
    2450684
  • Title

    The Behavior of Residual Impurities During the Crystal Growth of Tl3VS4(TVS)

  • Author

    Kun, Z.K. ; Weinert, B.W.

  • fYear
    1982
  • fDate
    27-29 Oct. 1982
  • Firstpage
    515
  • Lastpage
    518
  • Keywords
    Crystals; Electric resistance; Grain boundaries; Impurities; Inspection; Optical microscopy; Optical surface waves; Q measurement; Resonance; Scanning electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    1982 Ultrasonics Symposium
  • Conference_Location
    San Diego, CA, USA
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1982.197880
  • Filename
    1534820
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2450684