DocumentCode :
2450862
Title :
What do you mean my board test stinks?
Author :
Eklow, Bill
fYear :
2004
fDate :
26-28 Oct. 2004
Firstpage :
1423
Abstract :
Board level testing account for the functionality and performance of all the device placed on the board, and also account for how the devices are assembled on to the board and how the device interact with one another. Three areas of board and system level testing are structural testing, functional testing and parametric testing. Structural testing focuses on the assembly process given above. Parametric tests have well defined metrics like bit error rate and jitter. Functional testing are targeted very less in order to target the defects.
Keywords :
application specific integrated circuits; integrated circuit testing; application specific integrated circuits; assembly process; bit error rate; board level testing; functional testing; jitter; parametric testing; structural testing; system level testing; Application specific integrated circuits; Assembly; Bit error rate; Fault detection; Jitter; Performance evaluation; Software testing; Soldering; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2004. Proceedings. ITC 2004. International
Print_ISBN :
0-7803-8580-2
Type :
conf
DOI :
10.1109/TEST.2004.1387431
Filename :
1387431
Link To Document :
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