Title :
Thermo and Photo Displacement Microscopy
Author :
Martin, Y. ; Wickramasinghe, H.K. ; Ash, E.A.
Keywords :
Amplitude modulation; Equations; Frequency; Microscopy; Optical surface waves; Phase detection; Semiconductor lasers; Substrates; Surface acoustic waves; Temperature distribution;
Conference_Titel :
1982 Ultrasonics Symposium
Conference_Location :
San Diego, CA, USA
DOI :
10.1109/ULTSYM.1982.197890
