DocumentCode
2450931
Title
Characterization of conduction in LTG-GaAs
Author
Bourgoin, J.C. ; Khirouni, K. ; Nagle, J.
Author_Institution
Groupe de Phys. des Solides, Paris VI Univ., France
fYear
1996
fDate
29 Apr-3 May 1996
Firstpage
27
Lastpage
30
Abstract
The d.c. and a.c. electrical conduction has been studied in GaAs layer grown by molecular beam epitaxy between 150°C and 400°C. It is found that the admittance versus frequency, Y(ω), exhibits a universal behaviour. At low frequencies Y(ω) is constant, then exhibits a minimum at ωm. At high frequencies Y(ω) varies linearly as ω showing that conduction occurs via hopping. The temperature dependence of Y(0) indicates that this hopping conduction occurs in a partially filled band related to EL2 defects, the direct relationship between ωm and Y(0) demonstrates the existence of a percolation regime, i.e. of a conduction limited by insulating regions which we attribute to space charge regions developed around as precipitates
Keywords
III-V semiconductors; defect states; electric admittance; electrical conductivity; gallium arsenide; hopping conduction; molecular beam epitaxial growth; percolation; precipitation; semiconductor epitaxial layers; space charge; 150 to 400 degC; AC electrical conduction; DC electrical conduction; EL2 defects; GaAs; LTG-GaAs; admittance; conduction characterization; high frequencies; hopping conduction; low frequencies; molecular beam epitaxy; partially filled band; percolation regime; precipitates; space charge regions; temperature dependence; universal behaviour; Admittance; Conductivity; Electrons; Frequency; Gallium arsenide; Insulation; Molecular beam epitaxial growth; Space charge; Spectroscopy; Temperature dependence;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconducting and Semi-Insulating Materials Conference, 1996. IEEE
Conference_Location
Toulouse
Print_ISBN
0-7803-3179-6
Type
conf
DOI
10.1109/SIM.1996.570870
Filename
570870
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