• DocumentCode
    2450931
  • Title

    Characterization of conduction in LTG-GaAs

  • Author

    Bourgoin, J.C. ; Khirouni, K. ; Nagle, J.

  • Author_Institution
    Groupe de Phys. des Solides, Paris VI Univ., France
  • fYear
    1996
  • fDate
    29 Apr-3 May 1996
  • Firstpage
    27
  • Lastpage
    30
  • Abstract
    The d.c. and a.c. electrical conduction has been studied in GaAs layer grown by molecular beam epitaxy between 150°C and 400°C. It is found that the admittance versus frequency, Y(ω), exhibits a universal behaviour. At low frequencies Y(ω) is constant, then exhibits a minimum at ωm. At high frequencies Y(ω) varies linearly as ω showing that conduction occurs via hopping. The temperature dependence of Y(0) indicates that this hopping conduction occurs in a partially filled band related to EL2 defects, the direct relationship between ωm and Y(0) demonstrates the existence of a percolation regime, i.e. of a conduction limited by insulating regions which we attribute to space charge regions developed around as precipitates
  • Keywords
    III-V semiconductors; defect states; electric admittance; electrical conductivity; gallium arsenide; hopping conduction; molecular beam epitaxial growth; percolation; precipitation; semiconductor epitaxial layers; space charge; 150 to 400 degC; AC electrical conduction; DC electrical conduction; EL2 defects; GaAs; LTG-GaAs; admittance; conduction characterization; high frequencies; hopping conduction; low frequencies; molecular beam epitaxy; partially filled band; percolation regime; precipitates; space charge regions; temperature dependence; universal behaviour; Admittance; Conductivity; Electrons; Frequency; Gallium arsenide; Insulation; Molecular beam epitaxial growth; Space charge; Spectroscopy; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconducting and Semi-Insulating Materials Conference, 1996. IEEE
  • Conference_Location
    Toulouse
  • Print_ISBN
    0-7803-3179-6
  • Type

    conf

  • DOI
    10.1109/SIM.1996.570870
  • Filename
    570870