Title :
Synergetic features of fast cooling of semiconductor devices
Author :
Rybehenkov, A.A. ; Davydov, V.N.
Author_Institution :
Tomsk State Univ. of Control Syst. & Radioelectronics, Russia
Abstract :
Experimental results of the dependence of temperature of a solid on the cooling time of a sample from 300 K to 77 K are described with the purpose of finding out the physical processes which cause the change of electric properties of cooled electron semiconductor devices
Keywords :
cooling; heat conduction; semiconductor devices; 300 to 77 K; Cu; Cu-Zn; Sn; cooling time; electric properties; electron semiconductor devices; temperature effect; Conductivity; Containers; Cooling; Copper; Electron devices; Nitrogen; Semiconductor devices; Solids; Temperature dependence; Temperature measurement;
Conference_Titel :
Electron Devices and Materials, 2002. SIBEDEM 2002. The IEEE-Siberian Conference on
Conference_Location :
Tomsk
Print_ISBN :
0-7803-7274-3
DOI :
10.1109/SIBEDM.2002.998044