ITC 2004 panel: cost of test - taking control Mike Tripp Intel Corporation

Author

Tripp, Mike

Author_Institution

Intel Corp., USA

fYear

2004

fDate

26-28 Oct. 2004

Firstpage

1432

Abstract

Intel are focusing on the cost of test, but the focus is on the cost of quality. The quality goals are used to drive the process as a whole and optimize the steps within the process to minimize cost to Intel. DFT has been the key in our efforts to manage test costs in order to meet our goals. Our HVM products have focused DFT to enable test reuse or to enable low capability testers. In order to manage the cost of test, establish DFM requirements/goals during product definition and product design, standardize the test interface, establish the test cost goals and use predictive models for test content and test time, DFT enables the test problem to be avoided completely.

Keywords

cost reduction; design for manufacture; design for testability; integrated circuit design; integrated circuit testing; microprocessor chips; product design; quality control; DFM requirements; DFT; HVM products; ITC 2004 panel; Mike Tripp Intel Corporation; cost minimization; integrated circuit design; integrated circuit testing; low capability testers; microprocessor chips; predictive models; product definition; product design; quality cost; quality goals; testing cost; Cost function; Design for testability; Feedback; Manufacturing; Microprocessors; Monitoring; Packaging; Product design; Sockets; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2004. Proceedings. ITC 2004. International

Print_ISBN

0-7803-8580-2

Type

conf

DOI

10.1109/TEST.2004.1387440

Filename

1387440